{"type":"rich","version":"1.0","provider_name":"Transistor","provider_url":"https://transistor.fm","author_name":"MPD Q, A & I podcast","title":"MPD Q, A & I – Rethinking Quality Assurance Using AI and Computer Vision with Top Data Science","html":"<iframe width=\"100%\" height=\"180\" frameborder=\"no\" scrolling=\"no\" seamless src=\"https://share.transistor.fm/e/67aa907a\"></iframe>","width":"100%","height":180,"duration":2135,"description":"What if AI-based automation could improve your quality assurance without massive data requirements? In this episode of MPD Q, A & I, Kai Lehtinen, CEO of Top Data Science, shares how visual inspection using computer vision can deliver real results in manufacturing, even if you're starting without historical data. How do you turn a concrete business challenge into an automation solution that scales and delivers measurable value?Episode guests: Kai Lehtinen, CEO, Top Data ScienceHost: Mia Backman, DIMECCProduced by Manufacturing Performance Days","thumbnail_url":"https://img.transistorcdn.com/IBDstJpWyiSssWB9IjGALK2aciQU6ol9LqriSxjoB1o/rs:fill:0:0:1/w:400/h:400/q:60/mb:500000/aHR0cHM6Ly9pbWct/dXBsb2FkLXByb2R1/Y3Rpb24udHJhbnNp/c3Rvci5mbS9hNTM0/MDcyODg4MjI3ZDkz/ZGU5ZmEyMWM5M2Qz/ZTYyOC5wbmc.webp","thumbnail_width":300,"thumbnail_height":300}