Solutions for NanoAnalysis | Avoiding Sample Collisions in your SEM

Show Notes

Join us as we speak to Jack Mershon, Applications Specialist for Tescan USA Inc., about SEM advancements and the TESCAN Essence™ 3D Collision Model.

YouTube: 

Bruker Detectors https://youtu.be/4iHCLUG7RGw 

Website:  

Bruker Detectors https://www.bruker.com/en/products-and-solutions/elemental-analyzers/eds-wds-ebsd-SEM-Micro-XRF.html 

Essence™ 3D Collision Model – Tescan https://www.tescan.com/product/sem-for-materials-science-tescan-vega/ 

App Notes application notes:

Essence™ 3D Collision Model – Tescan flyer https://mbna.bruker.com/acton/attachment/15240/f-151ee2e2-f12c-4aa7-9864-7bb93c3f36b8/1/-/-/-/-/Tescan%20-%20Essence%203D%20collision%20model.pdf 

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What is Solutions for NanoAnalysis ?

Welcome to our Solutions for NanoAnalysis podcast brought to you by Bruker Nano Analytics. We look forward to bringing you a new podcast regularly.

Every session we will focus on a different problem that our colleagues face in the lab and in the field. Some of the solutions will be a variation of ideas you may have heard before or even worked with. We will bring you these topics in a new and interesting way and introduce you to updated and thought-provoking results. We will talk about how the problem was dealt with in the past and what we’re doing to solve the problem now and perhaps even envision future solutions.

Join us as we talk solutions with a variety of scientists and technicians in a variety of industries in our Solutions for NanoAnalysis Podcast.